Top layers of metal for integrated circuits

ABSTRACT

The present invention adds one or more thick layers of polymer dielectric and one or more layers of thick, wide metal lines on top of a finished semiconductor wafer, post-passivation. The thick, wide metal lines may be used for long signal paths and can also be used for power buses or power planes, clock distribution networks, critical signal, and re-distribution of I/O pads.

RELATED PATENT APPLICATIONS

This application is related to attorney docket number MSL98-002CCCCIP Ser. No. 10/154,662 filed on May 24, 2002, a continuation-in-part application of Ser. No. 10/058,259, filed on Jan. 29, 2002, now issued as U.S. Pat. No. 6,660,728, which is a continuation application of Ser. No. 09/251,183, filed on Feb. 17, 1999, now issued as U.S. Pat. No. 6,383,916, which is a continuation-in-part application of Ser. No. 09/216,791, filed on Dec. 21, 1998, abandoned, all of which are herein incorporated by reference in their entirety.

BACKGROUND OF THE INVENTION

(1) Field of the Invention

The invention relates to the manufacturing of high performance, high current, low power, and/or low voltage Integrated Circuit (IC's), and more specifically to methods of achieving high performance of the Integrated Circuits by reducing the capacitance and resistance of inter-connecting wiring on chip.

(2) Description of the Related Art

When the geometric dimensions of Integrated Circuits are scaled down, the cost per die is decreased while some aspects of performance are improved. The metal connections which connect the Integrated Circuit to other circuit or system components become of relative more importance and have, with the further miniaturization of the IC, an increasingly negative impact on the circuit performance. The capacitance and resistance of the metal interconnections increase, which degrades the chip performance significantly. Of most concern in this respect is the voltage drop along the power and ground buses and the RC delay of the critical signal paths. Attempts to reduce the resistance by using wider metal lines result in higher capacitance of these wires.

To solve this problem, the approach has been taken to develop low resistance metal (such as copper) for the wires while low-k dielectric materials are used in between signal lines. From the aspect of IC metal interconnection history, sputtered aluminum has been a mainstream IC interconnection metal material since the 1960's. The aluminum film is sputtered to cover the whole wafer, and then the metal is patterned using photolithography methods and dry and/or wet etching. It is technically difficult and economically expensive to create thicker than 2 μm aluminum metal lines due to the cost and stress concerns of blanket sputtering. About 1995, damascene copper metal became an alternative for IC metal interconnection. In damascene copper, the insulator is patterned and copper metal lines are formed within the insulator openings by blanket electroplating copper and chemical mechanical polishing (CMP) to remove the unwanted copper. Electroplating the whole wafer with thick metal creates large stress. Furthermore, the thickness of damascene copper is usually defined by the insulator thickness, typically chemical vapor deposited (CVD) oxides, which does not offer the desired thickness due to stress and cost concerns. Again it is also technically difficult and economically expensive to create thicker than 2 μm copper lines.

U.S. Pat. No. 5,212,403 (Nakanishi) shows a method of forming wiring connections both inside and outside (in a wiring substrate over the chip) for a logic circuit depending on the length of the wire connections.

U.S. Pat. No. 5,501,006 (Gehman, Jr. et a].) shows a structure with an insulating layer between the integrated circuit (IC) and the wiring substrate. A distribution lead connects the bonding pads of the IC to the bonding pads of the substrate.

U.S. Pat. No. 5,055,907 (Jacobs) discloses an extended integration semiconductor structure that allows manufacturers to integrate circuitry beyond the chip boundaries by forming a thin film multi-layer wiring decal on the support substrate and over the chip.

U.S. Pat. No. 5,106,461 (Volfson et al.) teaches a multi layer interconnect structure of alternating polyimide (dielectric) and metal layers over an IC in a TAB structure.

U.S. Pat. No. 5,635,767 (Wenzel et al.) teaches a method for reducing RC delay by a PBGA that separates multiple metal layers.

U.S. Pat. No. 5,686,764 (Fulcher) shows a flip chip substrate that reduces RC delay by separating the power and I/O traces.

Stanley Wolf in Silicon Processing for the VLSI Era, Vol. 2, pp. 214-217, Lattice Press, Sunset Beach, Calif. c. 1990, discusses the use of polyimide as an intermetal dielectric in the 1980's. However, many drawbacks of using polyimide are listed and polyimide has not been used for this purpose much in the time period since then.

SUMMARY OF THE INVENTION

It is the primary objective of the present invention to improve the performance of High Performance Integrated Circuits.

Another objective of the present invention is to reduce resistive voltage drop of the power supply buses that connect the IC to surrounding circuitry or circuit components.

Another objective of the present invention is to reduce resistance of the power supply buses for high current ICs.

Yet another objective of the present invention is to reduce resistance of IC metal interconnection for low voltage ICs.

Another objective of the present invention is to reduce resistance and load of IC metal interconnection for low power ICs.

A further objective of the present invention is to reduce the RC delay constant of the signal paths of high performance IC's.

A still further objective of the present invention is to facilitate the application of IC's of reduced size and increased circuit density.

Yet another objective of the present invention is to further facilitate and enhance the application of low resistance conductor metals.

Yet another objective of the present invention is to further facilitate and enhance the application of low capacitance conductor metals.

Yet another objective of the present invention is to allow for increased I/O pin count for the use of high performance IC's.

Yet another objective of the present invention is to simplify chip assembly by reducing the need for re-distribution of I/O chip connections.

Yet another objective of the present invention is to facilitate the connection of high-performance IC's to power/ground buses.

Yet another objective of the present invention is to facilitate the connection of high-performance IC's to clock distribution networks.

Yet another objective of the present invention is to reduce IC manufacturing costs by allowing or facilitating the use of less expensive process equipment and by accommodating less strict application of clean room requirements, as compared to sub-micron manufacturing requirements.

Yet another objective of the present invention is to be a driving force and stimulus for future system-on-chip designs since the present invention allows ready and cost effective interconnection between functional circuits that are positioned at relatively large distances from each other on the chip.

Yet another objective of the present design is to form the basis for a computer based routing tool that automatically routes interconnections that exceed a pre-determined length in accordance with the type of interconnection that needs to be established.

The present invention adds one or more thick layers of polymer dielectric and one or more layers of thick, wide metal lines on top of the finished device wafer passivation. The thick layer of dielectric can, for example, be of polyimide or benzocyclobutene (BCB) with a thickness of over, for example, 3 um. The thick, wide metal lines can, for instance, be of electroplated copper or gold. These layers of dielectric and metal lines are of primary benefit for long signal paths and can also be used for power/ground buses or power/ground planes, clock distribution networks, critical signal, or re-distribution of I/O pads for flip chip applications. The resistance times capacitance (RC product) of the thick, wide metal lines is substantially smaller than the RC product of the fine line metallization structure under the passivation.

Furthermore, a method for forming a post-passivation, top metallization system for high performance integrated circuits is provided. An integrated circuit is provided, having devices formed in and on a semiconductor substrate. An overlaying fine line interconnecting metallization structure with first metal lines is connected to the devices, and has a passivation layer formed thereover, with first openings in the passivation layer to contact pads connected to the first metal lines. A top metallization system is formed above the passivation layer, connected to the interconnecting metallization structure, wherein the top metallization system has top metal lines, in one or more layers, having a thickness and width substantially greater than the first metal lines, and wherein the top metallization system connects portions of the interconnecting metallization structure to other portions of the interconnecting metallization structure. Significantly, the RC product of the top metallization system is substantially smaller than the RC product of the interconnecting metallization structure under the passivation.

BRIEF DESCRIPTION OF THE DRAWINGS

FIGS. 1 a-1 b show a cross section of the interconnection scheme of the present invention.

FIGS. 2 a and 2 b show cross sections of the present invention in a more complex circuit configuration.

FIGS. 3 a-3 j shows a method of forming the post-passivation scheme for transitioning from a fine-line interconnection to the post passivation interconnection of the invention.

FIGS. 4 a and 4 b show an extension of the IC interconnect scheme by adding power, ground and signal distribution capabilities.

FIG. 5 a shows detail regarding a fan-out function in a flip-chip BGA device.

FIG. 5 b shows a schematic view of fan-out connections between top pads of post-passivation metal scheme and lower pads of fine-line metal scheme using the post-passivation interconnection to replace the fan-out function of the BGA substrate interconnection as in the example of FIG. 5 a.

FIG. 6 a shows detail regarding a pad relocation function in a flip-chip BGA device.

FIG. 6 b shows a schematic view of pad relocation connections between top pads of post-passivation metal scheme and lower pads of fine line metal scheme using the post-passivation interconnection to replace the pad relocation function of the BGA substrate interconnection as in the example of FIG. 6 a.

FIG. 7 a shows detail regarding the usage of common power, ground and signal pads in a flip-chip BGA device.

FIG. 7 b shows a schematic view of common power, ground and signal pad connections between top pads of post-passivation metal scheme and lower pads of fine line metal scheme) using the post-passivation interconnection to replace the common pad function of the BGA substrate interconnection as in the example of FIG. 7 a.

FIG. 8 a shows detail regarding pad addition in a flip-chip BGA device. One contact pad on the chip is connected to several contact points on the BGA substrate.

FIG. 8 b shows a schematic view of pad addition connections between top pads of post-passivation metal scheme and lower pads of fine line metal scheme using the post-passivation interconnection to replace the pad addition function of the BGA substrate interconnection as in the example of FIG. 8 a. One contact point on the fine line metal scheme is connected to several contact points of the post-passivation scheme.

DETAILED DESCRIPTION OF THE INVENTION

The present invention teaches an Integrated Circuit structure where key re-distribution and interconnection metal layers and dielectric layers are added over a conventional IC. These re-distribution and interconnection layers allow for wider buses and reduce conventional RC delay.

FIG. 1 a shows a cross-sectional representation of a general view of the invention. Devices 2 are formed in and on a semiconductor substrate 1, and metallization is accomplished in one or more layers of IC Interconnection 3, above the device layer. These metal layers are referred to as fine line metal interconnections. Typically, the intermetal dielectric (IMD) layers comprise silicon-based oxides, such as chemical vapor deposited (CVD) silicon oxide, CVD TEOS oxide, spin-on-glass (SOG), fluorosilicate glass (FSG), high density plasma CVD oxides, or the composite layer formed by a portion of this group of materials. The IMD layers typically have a thickness of between about 1,000 and 10,000 Angstroms. The fine line metal interconnections are typically formed by sputtering aluminum or an aluminum alloy and patterning the aluminum to form the fine metal lines. Alternatively, the fine lines may be formed by a copper damascene process. In the copper damascene process, the copper is protected by an adhesion/barrier layer not only underlying the copper, but also surrounding the copper at the sidewalls of the line through the IMD in order to prevent the migration of copper ions which could adversely affect the underlying active devices. These fine lines typically have a thickness of between about 1,000 and 10,000 Angstroms. In the fabrication process of the fine line metal interconnections, a clean room environment of class <=10 is typical. That is, no more than 10 particles larger than 0.5 microns are found in any given cubic foot of air. The fine line IC metal is fabricated using 5× steppers or scanners or better and using a photoresist layer having thickness of less than about 5 microns. The IC interconnection connects the devices to one another to form operational circuits, and also has in its top layer of metal points of electrical contact (such as bond pads), which provide connections from the IC interconnection layer to outside of the IC.

A passivation layer 4 covers the IC interconnection scheme, while providing openings to the electrical contact points. The most frequently used passivation layer in the present state of the art is plasma enhanced CVD (PECVD) oxide and nitride. In creating layer 4, a layer of approximately 0.5 μm PECVD oxide is deposited first followed by a layer of greater than approximately 0.3 μm and preferably, about 0.7 μm nitride. Passivation layer 4 is very important because it protects the device wafer from moisture and foreign ion contamination. At least a nitride layer of greater than about 0.3 μm thick must be used in order to adequately prevent mobile ion and/or moisture penetration. The positioning of this layer between the sub-micron process (of the integrated circuit) and the tens-micron process (of post-passivation technology 80) is of critical importance since it allows for a cheaper process that has less stringent clean room requirements for the process of creating the interconnecting metallization structure above passivation 4.

In addition to PECVD oxide and PECVD nitride, passivation layer 4 may also be formed of silicon oxynitride, phosphosilicate glass (PSG), borosilicate glass (BSG), borophosphosilicate glass (BPSG), or combinations thereof.

In a key aspect of the invention, the passivation openings can be as small as 0.1 um. In another critical aspect of the invention, a selective deposition process is used to form the Post Passivation Technology segment 80, in which metal lines are formed having a substantially smaller RC product than that of the metal lines in the IC Interconnection layer. More detail is provided below.

Referring now more specifically to FIG. 1 b, there is shown a cross section of one implementation of the present invention. A silicon substrate 1 has transistors and other devices, typically formed of polysilicon and other materials, covered by a dielectric layer 2 deposited over the devices and the substrate. Source and drain diffusions 120 are shown within the substrate. Layer 3 indicates the totality of metal layers and dielectric layers that are typically created on top of the device layer 2. Points of contact 6, such as bonding pads known in the semiconductor art, are in the top surface of layers 3 and are part of layer 3. These points of contact 6 are points within the IC arrangement that need to be further connected to surrounding circuitry, that is to power lines or to signal lines. A passivation layer 4, formed of for example silicon nitride, is deposited on top of layer 3, as is known in the art for protecting underlying layers from moisture, contamination, etc.

The key steps of the invention begin with the optional deposition of a thick insulating layer 5 of a polymer. Layer 5 is a thick polymer insulating layer (for example polyimide) that has a thickness in excess of 2 um (after curing). The range of polymer thickness can vary from 2 μm to 100 μm, dependent on electrical design requirements. The polymer insulating layer 5 is thicker than the intermetal dielectric layers in the interconnecting, fine-line, metallization structure by 2 to 500 times.

For the deposition of layer 5 the polymer can be spin-on coated and cured. After spin-on coating, the polymer will be cured at 380 degrees C. for 4 hours in a vacuum or nitrogen ambient. For thicker polymer, the polymer film can be multiple coated and cured. Alternatively, the polymer layer can deposited by screen printing or by laminating a dry layer of polymer.

A polymer such as a polyimide (HD Microsystems, Parlin, N.J.) can be used as the polymer. Another material that can be used to create layer 5 is the polymer benzocyclobutene (BCB) (Dow Chemical Company, Midland, Mich.), which has recently gained acceptance to be used instead of typical polyimide application. Yet other possible materials for layer 5 include a silicone elastomer or parylene. The epoxy-based material such as photoepoxy SU-8 (Sotec Microsystems, Renens, Switzerland) can also be used.

A pattern 7 is exposed and etched through the polymer insulating layer 5 and the passivation layer 4 over the contact points 6. First metal layer 10 is then selectively deposited to contact points 6 through the polymer and passivation layers, as hereinafter described.

In one important aspect of the current invention, referring now to FIGS. 3 a-3 j, and specifically FIG. 3 a, openings 7 in the polymer insulating layer 5 may be larger than openings 7′ in the passivation layer 4. Openings 7′ may be formed to as small as 0.1 μm, and may range in size from between about 0.1 and 50 μm. Openings 7 in the polymer insulating layer 5 may be greater than or equal to about 2 μm. These small passivation vias 7′ are advantageous for the following reasons:

-   -   (1) Small passivation vias only need small underlying metal pads         (or dog bone structures); and these small metal pads will not         block the routing capability of the top layer metal in the IC         fine line interconnection scheme.     -   (2) Since the thickness of the inter-metal-dielectric (IMD) in         the IC fine line interconnection is thin, a small metal pad         provides reduced capacitance.

Electrical contact with the contact points 6 can now be established by filling the openings 7 (and 71) with a conductor. Simultaneously with filling of the openings 7, a first interconnect metal layer may be formed, as shown in FIG. 3 a. The process steps are described in FIGS. 3 b-3 j. In FIGS. 3 a and 3 b, a photo-sensitive polymer insulating layer 5 is deposited over the passivation layer 4 and the passivation opening 7′. The deposited polymer is then exposed to create openings 7 aligning with the passivation opening 7′. In FIG. 3 c, a thick metal layer is formed by first sputtering an adhesion/barrier layer 200. The adhesion/barrier layer is formed of titanium tungsten (TiW), chromium (Cr), titanium (Ti), tantalum nitride (TaN), or titanium nitride (TiN), and is deposited to a thickness of between about 0.01 and 3 microns. An electroplating seed layer 202 is then deposited by sputtering, the seed layer material being copper (Cu), gold (Au), silver (Ag), palladium (Pd) or nickel (Ni), formed to a thickness of between about 0.05 and 3 microns. Cu is used as the seed layer when copper is to be electroplated, Au used as the seed layer for plating gold, Ag used as the seed layer for plating silver, Pd used as seed layer for plating palladium, and Ni used as seed layer for plating nickel.

A thick photoresist 203, as depicted in FIG. 3 d, of between about 2 and 100 microns thickness, is next deposited and patterned over the seed layer. In a selective deposition process, a thick layer of metal, such as copper (Cu), gold (Au), silver (Ag), palladium (Pd) or nickel (Ni), is then electroplated to a thickness of between about 2 and 100 microns, as shown in FIG. 3 e, to form thick, wide metal interconnections 204 and to fill openings 7 and 71. Thus, a selective deposition process forms the post-passivation metal structure. An advantage of the selective deposition process of the invention is a minimization of wasted material, especially when precious metal, such as gold, silver, or palladium is used. In the selective deposition process, the metal is electroplated only where it is needed. In contrast, in the standard metal damascene process used for fine line metallization, metal is electroplated everywhere and then etched or polished away where it is not needed. Covering the whole wafer with thick metal creates stress which causes the process problem. This is a waste of metal, especially for the cases when precious metal is used. The removed metal is often contaminated and may not be able to be reused or may be very expensive to be reused.

Furthermore, in the selective deposition process of the invention, the thickness of selective electroplated metal is defined by the thickness of photoresist, which can be formed as thick as 100 microns. In other words, it is feasible and cost-effective to form thick metal by selective electroplating. By contrast, it is technically difficult to form thick metal by a damascene copper process. A primary limitation to forming thick copper damascene lines is the thickness of the chemical vapor deposited (CVD) oxides which define the damascene copper thickness. CVD oxides cannot be thickly deposited due to stress concerns. It is also very expensive to deposit thick CVD oxides.

Referring now to FIGS. 3 f and 3 g, the photoresist is then stripped, and portions of the seed metal and adhesion metal removed, using the thick metal as an etch mask. During the self-aligned wet etching of the adhesion/barrier layer, an undercut 205 is formed in the adhesion/barrier layer 200, as shown in FIG. 3 g. The undercut is usually between about 0.03 to 2.0 micron per side, depending on etching recipe and over-etch time. The structure of the thick, wide, post-passivation metal interconnections is different from the structure of the fine line interconnections. In addition to the undercut 205 in the adhesion/barrier layer, there is a clear boundary between the sputtered thin gold layer 202 and the electroplated thick gold 204. This can be seen, for example, in a transmission electron microscope (TEM) image. The boundary is due to different grain sizes and/or grain orientation in the two gold layers 202 and 204. For example, in a 1,000 Angstroms thick sputtered gold layer 202 under a 4 microns thick electroplated gold layer 204, the grain size of the sputtered gold layer 202 is about 1,000 Angstroms, and the grain boundary is perpendicular to the surface of substrate. The grain size of the electroplated gold 204 is greater than 2 microns with the grain boundary not perpendicular, and typically, at an angle of about 45 degrees from the substrate surface. In the fine line metal interconnections, there is no undercutting or clear boundary of grain size difference inside the aluminum layer.

Where Cu is used for electroplating, an optional nickel cap layer 206 may be used to prevent copper corrosion, as shown in FIG. 3 h. Additionally, the adhesion/barrier layer 200 in the post-passivation metal structure is formed only under the copper line, as shown in FIG. 3 h. In the copper damascene process of the fine line metallization, the adhesion/barrier layer is adjacent to the copper not only at the bottom, but also at the sidewalls of the copper line.

In more detail, the clean room environment of the post-passivation metal process can be class 100 or more; that is, containing more than 100 particles larger than 0.5 microns in any given cubic foot of air. During photolithography in the post-passivation metal process, aligners or 1× steppers are used with a photoresist having a thickness of greater than about 5 microns. This contrasts with the fine line IC metal, fabricated using 5× steppers or scanners or better in a class 10 environment or better and using a photoresist layer having thickness of less than 5 microns. The thick, wide metal lines have a thickness of between about 2 and 100 microns and a width of greater than about 2 microns. Furthermore, the spacing between two adjacent thick, wide metal lines at the same layer is greater than about 2 microns.

Subsequent metal layers may be formed in a similar manner to that shown for the first metal layer in FIGS. 3 a-h. For example, referring to FIG. 3 i, another thick intermetal polymer layer 222 is deposited over the interconnect line 204 as described above and an opening 223 formed for connection of the next metal layer to the first metal layer. A step 222′ exists in the intermetal polymer layer at the edge of the underlying thick metal. Polymer like polyimide is usually a good planarization material, especially in filling small metal gaps. However, the degree of planarization is not 100%. For post-passivation thick metal, the intermetal polymer layer may require a planarization process. FIG. 3 j shows a polymer layer planarized by the chemical-mechanical polishing (CMP). The step 222′ in FIG. 3 i disappears in FIG. 3 j. CMP can be performed before or after the intermetal polymer opening is formed. Adhesion and electroplating seed layers are then sputtered, a thick photoresist deposited and the next thick, wide metal layer electroplated, in a similar manner to the first metal layer. It will be understood that the intermetal polymer layer 222 can be deposited in a like manner over the thick, wide metal line having the nickel cap, as shown in FIG. 3 h. The intermetal polymer can be planarized or not, as shown in FIGS. 3 j and 3 i, respectively.

The thick, wide metal 204 of the post passivation process of the invention is thicker then the typical fine-line metal layers 3 by a ratio of between about 2 and 1000 times. The thick, wide metal layers are formed into interconnecting lines that also are wider than the fine-line metal by a ratio of between about 2 and 1000 times. The thick, wide metal lines have a thickness of between about 2 and 100 μm, and a width of greater than or equal to 2 μm. Line spacing preferably is greater than or equal to 2 μm. Thicker, wider metal in the post-passivation process of the invention reduces the resistance of these interconnections.

Resistance of metal interconnections in an integrated circuit is determined by the material to be used and metal thickness and width, while capacitance is related to dielectric types, thickness, and metal line width, spacing, and thickness. Metal capacitance includes three components: 1) plate capacitance which is a function of the metal width to dielectric thickness aspect ratio, 2) coupling capacitance which is a function of the metal thickness to line spacing aspect ratio, and 3) fringing capacitance which is a function of metal thickness, spacing, and dielectric thickness.

In a first example, to the extreme of the fine line metal capability, fine line metal thickness is about 2 μm, fine line metal width is about 10 μm, fine line IMD thickness is about 2 μm, and the line spacing is about 10 μm. Post-passivation metal thickness is about 5 μm, metal width is about 10 μm, dielectric thickness is about 5 μm, and lines spacing is also about 10 μm. The metal thickness difference results in a 2.5 times reduction in resistance in the post-passivation metal structure over the fine line metal structure. The dielectric thickness results in a 2.5 times difference in capacitance in the post-passivation metal structure over the fine line metal structure. Then, the reduction in resistance times capacitance (RC product) is 6.25 times, or about 5 times.

In a second example, fine line metal thickness is about 1 μm, fine line metal width is about 10 μm, fine line IMD thickness is about 0.5 μm, and the line spacing is about 2 μm. Post-passivation metal thickness is about 5 μm, metal width is about 10 μm, dielectric thickness is about 5 μm, and lines spacing is about 10 μm. The metal thickness difference results in about a 5 times reduction in resistance in the post-passivation metal structure over the fine line metal structure. The capacitance is dominated in this case by plate capacitance with a reduction of 10 times difference in capacitance in the post-passivation metal structure over the fine line metal structure. Then, the reduction in RC product is about 50 times.

In a third example, typical capability fine line metal thickness is about 0.4 μm, fine line metal width is about 0.2 μm, fine line IMD thickness is about 0.4 μm, and the line spacing is about 0.2 μm. Post-passivation metal thickness is about 5 μm, metal width is about 10 μm, dielectric thickness is about 5 μm, and line spacing is about 10 μm. The metal thickness difference results in about a 625 times reduction in resistance in the post-passivation metal structure over the fine line metal structure. The capacitance is dominated by coupling capacitance and results in about a 4 times difference in capacitance in the post-passivation metal structure over the fine line metal structure. Then, the reduction in RC product is about 2,500 times.

In a fourth example, typical capability fine line metal thickness is about 0.4 μm, fine line metal width is about 0.2 μm, fine line IMD thickness is about 0.4 μm, and the line spacing is about 0.2 μm. Post-passivation metal thickness is about 10 μm, metal width is about 10 μm, dielectric thickness is about 10 μm, and line spacing is about 40 μm. The metal thickness difference results in about a 1250 times reduction in resistance in the post-passivation metal structure over the fine line metal structure. The capacitance is dominated by coupling capacitance and results in about an 8 times difference in capacitance in the post-passivation metal structure over the fine line metal structure. Then, the reduction in RC product is about 10,000 times.

Summarizing the above discussion, the RC product of the post-passivation metal structure can be about 5 to 10,000 times smaller than the RC product of the fine line metal structure.

It is difficult to achieve 100 times smaller RC product for the top layer metal of a fine line metallization system when compared to the bottom layer metal in the fine line metal interconnection process. For example, the metal line resistance at the top layer metal can be reduced by designing a wide piece of metal, while the capacitance of that metal line will be increasing accordingly (because the IMD is thin). Essentially, it is hard for fine line IC metals to achieve even 10 times smaller RC product for its top metal layer versus its bottom metal layer.

In one embodiment of the invention, insulating polymer layer 5 may be omitted, with the thick metal layer formed directly on passivation layer 4 and connecting to the underlying metal pads.

Co-pending U.S. patent application Ser. No. 10/154,662, attorney docket number MSL98-002CCCCIP filed on May 24, 2002, herein incorporated by reference in its entirety, describes variations of the above-described process for forming the thick metal layers, including damascene processes. The RC product of the thick, wide, metal lines formed by these other methods is still significantly smaller than the RC product of the fine line metal lines, as detailed above.

Referring now back to FIG. 1 b, the tops of the top metal conductor can now be used for connection of the IC to its environment, and for further integration into the surrounding electrical circuitry. Metal structures 10 and 26 are shown; these metals can be of any design in width and thickness to accommodate specific circuit design requirements. Metal structure 10 can, for instance, be used as a wirebonding pad, or a pad for a solder bump or a gold bump. Metal structure 26 can be used for power distribution or as a ground or signal bus.

FIGS. 2 a and 2 b show how the present invention as indicated in FIG. 1 b can be further extended to include multiple layers of metal. The lower level build up of this cross section is identical to the build up shown in FIG. 1 b with a silicon wafer 1, the poly silicon layer 2, the metal and dielectric combined layer 3, the passivation layer 4, the insulating polymer layer 5 and the first metal 10, formed by selective deposition on top of layer 5. The function of the structure that has been described in FIG. 1 b can be further extended by depositing another layer of intermetal polymer 14 on top of the previously deposited insulating polymer layer 5 and overlying the first metal 10. Selective deposition is used for second metal 12. This second metal 12 can be connected with first metal 10 through opening 13. Depositing second metal 12 on top of layer 14 can thus further extend this process. Additional alternating layers of intermetal polymer and metal lines and/or power or ground planes may be added above layers 12 and 14, as needed. A top polymer layer 16 may be formed as shown. Opening 27 may be made in the top polymer layer 16 for connection to external circuits or for testing. Connections may be made to external circuits through solder bumps, gold bumps, or wirebonds.

Since polymer, for example polyimide, cannot perfectly planarize underlying steps, gaps, or dips, there are concerns in the subsequent processes. In the post-passivation process, the thick metal creates big steps and gaps, and the thick polymer dielectric in addition generates deep openings. In FIG. 2 a, openings 5′ in the polymer insulating layer 5 results in dips 10′ at the surface of the first post-passivation metal layer 10. In addition to the dips 10′, there is a metal gap 10″ between two pieces of the first metal 10. The dips 10′ and gap 10″ further result in dips 14′ at the surface of the first intermetal polymer layer 14, dips 12′ at the surface of the second metal layer 12, and dips 16′ at the surface of the top polymer layer 16. In FIG. 2 b, the first intermetal polymer layer 14 is planarized by chemical-mechanical polishing (CMP). Dips 14′ at the surface of the first intermetal polymer layer 14, dips 12′ at the surface of the second metal layer 12, and dips 16′ at the surface of the top polymer layer 16, all shown FIG. 2 a, do not appear in FIG. 2 b using the CMP process.

The insulating polymer layer 5 and intermetal polymer layer 14 that are formed between the thick, post-passivation metal lines are formed to a thickness of between about 2 and 30 microns, after curing, and are thicker than the intermetal dielectric layers formed in the typical fine-line metal scheme (layers 3) by a ratio of between about 2 and 500. The thicker, organic polymer used in the post-passivation process of the invention reduces capacitance between the thick metal lines. The inorganic materials, such as silicon oxide, used in the fine-line metallization system 3, cannot be formed to such thicknesses due to a tendency to crack at these thicknesses. This reduced capacitance reduces RC product of the post passivation metal system of the invention, as described above.

FIG. 1 b shows a basic design advantage of the invention. This advantage allows for the sub-micron or fine-lines, that run in the immediate vicinity of the metal layers 3 and the contact points 6, to be extended in an upward direction 20 through metal interconnect 71 formed in the openings 7 of the insulating polymer layer 5 and in the openings 7′ of the passivation layer 4. This extension continues in the direction 22 in the horizontal plane of the thick, wide metal interconnect 10 and comes back down in the downward direction 24 through metal interconnect 72 formed in the openings 7 of the insulating polymer layer 5 and in the openings 7′ of the passivation layer 4. The functions and constructs of the passivation layer 4 and the insulating polymer layer 5 remain as previously highlighted. This basic design advantage of the invention is to “elevate” or “fan-up” the fine-line interconnects and to remove these interconnects from the micron and sub-micron level to a post-passivation metal interconnect level that has considerably larger dimensions and is therefore characterized by smaller resistance and capacitance and is easier and more cost effective to manufacture. It therefore further adds to the importance of the invention in that it makes micron and sub-micron wiring accessible at a wide-metal level. The interconnections 71 and 72 interconnect the fine-level metal by going up through the passivation and polymer or polyimide dielectric layers, traverses over a distance on the thick, wide-metal level and continues by descending from the thick, wide-metal level back down to the fine-metal level by again traversing down through the passivation and polymer or polyimide dielectric layers. The extensions that are in this manner accomplished need not to be limited to extending fine-metal interconnect points 6 of any particular type, such as signal or power or ground, with thick, wide metal line 26.

FIGS. 4 a and 4 b show how the interconnect aspect of the invention (as shown by arrows 20/22/24 of FIG. 1 b) can further be extended to add external power, ground and signal distribution. This allows two portions of an internal circuit to be connected externally using a single pin-in or pin-out. Top polymer layer 16 has an opening 28 for the external connection. Connections to the next level of packaging may be made through solder bumps, gold bumps, or wirebonds. There is the possibility of many contact points to the next level package. In this case, the next level package, for example, a BGA substrate, requires fine pitch metals to accommodate these many contact points. By being able to readily extend the post-passivation metal dimensions it also becomes possible to interconnect power, ground and signal lines at a post-passivation metal level thereby reducing the cost and complexity of performing this function in a BGA substrate. FIG. 4 b further shows opening 29 in the passivation layer 4 made to a top layer 6 of the fine-line interconnection metallization structure. Opening 28 is made to an upper contact point 26 in the thick, wide metallization structure while opening 29 is made to a lower contact point 6 in the fine-line interconnection metallization structure. Connections to the next level of packaging may be made to the lower contact point through opening 29 through solder bumps, gold bumps, or wirebonds.

FIGS. 5 through 8 show further detail to demonstrate the concepts of fan-out, pad relocation, the creation of common ground, power and signal pads, and the creation of additional pads.

FIG. 5 a shows the concept of fan-out for a flip-chip on a BGA substrate. A cross section of an integrated circuit 100 is shown with five solder bumps 101 through 105. By using a BGA substrate 130 and the wiring 107 within the substrate 130, bump 101 can be repositioned to location 111, bump 102 to location 112, etc. for the remaining solder bumps 103 through 105. The separation of contact points 111 through 115 is considerably larger than the separation of the original solder bumps 101 through 105. The BGA substrate allows for spreading the distance between the contact points or bumps of the BGA device.

FIG. 6 a shows the concept of pad relocation for a flip chip on a BGA substrate. Contact bumps 101 through 105 are shown. By using BGA substrate 130 and the wiring 131 that is provided within the substrate, the BGA pads can be arranged in a different and arbitrary sequence that is required for further circuit design or packaging. For instance contact bump 101, which is on the far left side of the IC 100, is re-routed to location 124 which is on the second far right of the BGA substrate 130. The re-arrangements of the other BGA solder bumps can readily be learned from following the wiring 131 within the substrate 130 and by tracing from solder bump to one of the contact points 121 through 125 of the BGA substrate.

FIG. 7 a shows pad reduction, the interconnecting of solder bumps into common power, ground or signal pads on a flip-chip BGA substrate. The IC 100 is again shown with five solder bumps 101 through 105. The BGA substrate 130 contains a wiring scheme that contains in this example three wiring units, one for each for the power, ground and signal bumps of the IC. Wire arrangement 132 connects solder bumps 101, 103 and 105 to interconnect point 138 of the BGA substrate 130. It can further be seen that solder bump 104 is connected to interconnect point 140 of the BGA substrate by means of the wire arrangement 136, while solder bump 102 is connected to interconnect point 142 of the BGA substrate by means of the wire arrangement 134. The number of pins required to interconnect the IC 100 is in this manner reduced from five to three. For more solder bumps, as is the case for a typical flip-chip IC, the numeric effect of the indicated wiring arrangement is considerably more beneficial.

FIG. 8 a shows pad addition, the interconnecting of single solder bumps into several contact points on a flip-chip BGA substrate. The IC 100 is shown with three solder bumps 101, 103, 105. The BGA substrate 130 contains a wiring scheme that contains in this example three wiring units. Wire arrangement 153 connects solder bump 103 to three interconnect points 161, 163 and 165 of the BGA substrate 130. It can further be seen that solder bump 101 is connected to interconnect point 162 of the BGA substrate by means of the wire arrangement 151, while solder bump 105 is connected to interconnect point 164 of the BGA substrate by means of the wire arrangement 155. The number of pins required to interconnect the IC 100 is in this manner increased from three to five. The added two contact points 161, 165 on the BGA substrate are useful for connecting to the next level package.

The concept of fan-out, pad relocation, pad reduction, and pad addition can be realized using the post-passivation metal interconnection scheme described in this invention, to replace the function of BGA substrate 130. From FIGS. 5 b, 6 b, 7 b, and 8 b, it can be seen that the extended functionality and extended wiring ability that are provided by the interconnect wiring schemes that are typically created in the BGA substrate 130 can be created using the method of the invention, on device 100. Some of the methods and possibilities of interconnect line routing that can be implemented using the method of the invention are highlighted in the following paragraphs.

Fan-out capability can be provided by the invention, using the metal conductors within the openings through the passivation layer that connect electrical contact pads of the top metallization structure with contact points of the interconnecting metallization structure. FIG. 5 b shows a schematic view of the connections between the post-passivation metal pads 111-115 and the fine line metal pads 101-105 using fan-out. Each of the electrical contact points of the interconnecting metallization structure is connected directly and sequentially with at least one electrical contact point of the post-passivation metallization structure. In a fan-out scheme, the distance between electrical contact points of the post-passivation metallization structure is larger than the distance between electrical contact points of the fine line interconnecting metallization structure.

Pad relocation may also be accomplished by the method of the invention. FIG. 6 b is a schematic view of connections between post-passivation metal pads 121-125 and fine line metal pads 101-105, showing pad relocation. Electrical contact points of the post-passivation metallization structure are connected with the contact points of the fine line interconnecting metallization structure, directly but not necessarily sequentially, thereby creating a pad relocation effect.

A reduction effect may also be accomplished by the method of the invention, wherein common nodes are connected together. FIG. 7 b shows a schematic view of connections between post-passivation metal pads 138, 140, and 142 and fine line metal pads 101-105. Electrical contact points of the post-passivation metallization structure are connected with contact points of the fine line interconnecting metallization structure, where fewer contact points are used in the post-passivation metallization structure, since functionally equivalent contact points in the fine line interconnecting metallization structure are connected together. That is, the number of contact points for a particular electrical function among the electrical contact points of the post-passivation metallization structure is smaller than the number of electrical contact points of the fine line interconnecting metallization structure.

An addition effect may also be accomplished by the method of the invention, wherein a single node is connected to several contact points at different locations. FIG. 8 b shows a schematic view of connections between post-passivation metal pads 161-165 and fine line metal pads 101, 103 and 105. Electrical contact points of the post-passivation metallization structure are connected with contact points of the fine line interconnecting metallization structure, where more contact points are used in the post-passivation metallization structure, since a single point in the fine line interconnecting metallization structure is connected to several contacts on the post-passivation metal structure with equivalent electrical functionality. That is, the number of contact points for a particular electrical function among the electrical contact points of the post-passivation metallization structure is greater than the number of electrical contact points of the fine line interconnecting metallization structure.

Some of the advantages of the present invention are:

-   1) improved speed of the IC interconnections due to the use of     thick, wide metal lines (which results in lower resistance) and     thicker dielectrics between the interconnecting lines (which results     in lower capacitance and reduced RC delay). The improved speed of     the IC interconnections results in improved performance of High     Performance IC's. -   2) an inexpensive manufacturing process since there is no need for     expensive equipment that is typically used in sub-micron IC     fabrication; there is also no need for the extreme clean room     facilities (class 10 or less) that are typically required for     sub-micron manufacturing. Class 100 or more clean rooms can be used     for the post-passivation process of the invention. -   3) power/ground buses and clock distribution networks are easier to     integrate within the design of IC's. -   4) system-on-chip designs will benefit from the present invention     since it allows ready and cost effective interconnection between     functional circuits that are positioned at relatively large     distances from each other on the chip. -   5) form the basis for a computer based routing tool that     automatically routes interconnections that exceed a pre-determined     length in accordance with the type of interconnection that needs to     be established. -   6) provide a means to standardize BGA packaging. That is, a     customization usually achieved by wiring in the BGA substrate can be     moved to the post-passivation metallization structure of the     invention. -   7) be applicable to solder bumps, gold bumps, and wirebonding for     making further circuit interconnects. -   8) provide a means for fan-out, relocation, and pad number reduction     and addition using solder bump, wirebond, and gold bump. -   9) provide a means for pad fan-out, relocation, reduction and     addition thereby providing increased flexibility. By fan-out,     relocation, reduction and addition of the pads, flexibility for     fitting into varieties of next level packaging by wirebonding,     solder bumps or gold bumps is achieved. This flexibility in pad     location, pad number and pad arrangement is very useful in     system-in-package and multi-chip module approaches. -   10) provide a means for common power, ground and signal lines     thereby reducing the number of pins required to interconnect with     surrounding circuits. -   11) provide a means for fan-up function by the application of small     passivation (0.1 um or more) vias. -   12) provide the means for extending a fine-wire interconnect scheme     to a wide-wire interconnect scheme. -   13) replace BGA interconnections by providing     finer-than-BGA-substrate metal design rules on the post-passivation     metal scheme. The BGA design can therefore be simplified, and the     cost is greatly reduced.

Although the preferred embodiment of the present invention has been illustrated, and that form has been described in detail, it will be readily understood by those skilled in the art that various modifications may be made therein without departing from the spirit of the invention or from the scope of the appended claims. 

1. A method for forming a post-passivation metallization system for integrated circuits, comprising: providing an integrated circuit comprising a plurality of devices formed in and on a semiconductor substrate, with an overlaying interconnecting fine line metallization structure connected to said devices and comprising a plurality of first metal lines in one or more layers, and having a passivation layer formed thereover, with first openings in said passivation layer to contact pads connected to said first metal lines; wherein said first openings are as small as 0.1 um; and forming, in a selective deposition process, said post-passivation metallization system in said first openings and over said passivation layer, connected to said interconnecting fine line metallization structure, wherein said post-passivation metallization system comprises a plurality of top metal lines, in one or more layers, having a resistance times capacitance (first RC product) smaller than a second RC product of said first metal lines by at least 5 times.
 2. The method of claim 1 wherein said post-passivation metallization system connects portions of said interconnecting fine line metallization structure to other portions of said interconnecting fine line metallization structure.
 3. The method of claim 1 wherein said post-passivation metallization system connects portions of said interconnecting fine line metallization structure to external circuits by solder bumps, gold bumps, or wirebonds.
 4. The method of claim 1 wherein said forming a first layer of said post-passivation metallization system in said selective deposition process comprises the steps of: sputtering a thin metal layer, in said first openings and over said passivation layer; depositing a layer of photoresist over said thin metal layer; forming second openings in said photoresist over said first openings, said second openings defining metal lines for a first metal layer of said post-passivation metallization system; electroplating a metal layer in said second openings, forming metal lines in said first metal layer; removing said photoresist; and removing said thin metal layer in areas not covered by said metal lines.
 5. The method of claim 4 wherein said sputtering a thin metal layer comprises the steps of: sputtering an adhesion/barrier layer; and sputtering an electroplating seed layer over said adhesion/barrier layer.
 6. The method of claim 5 wherein said adhesion/barrier layer is selected from the group comprising titanium tungsten (TiW), chromium (Cr), titanium (Ti), tantalum nitride (TaN), and titanium nitride (TiN), and is deposited to a thickness of between about 0.01 and 3 microns.
 7. The method of claim 5 wherein said electroplating seed layer is selected from the group comprising copper (Cu), gold (Au), silver (Ag), palladium (Pd) and nickel (Ni) to a thickness of between about 0.05 and 3 microns.
 8. The method of claim 5 wherein said metal layer is selected from the group comprising copper (Cu), gold (Au), silver (Ag), palladium (Pd) and nickel (Ni) to a thickness of between about 2 and 100 microns.
 9. The method of claim 4 wherein said removing said thin metal layer comprises the steps of: removing said electroplating seed layer; and removing said adhesion/barrier layer.
 10. The method of claim 1, wherein said post-passivation metallization system comprises metal lines formed to a thickness of between about 2 and 1000 times thicker than metal lines in said fine line interconnecting metallization structure, and formed to a width of between about 2 and 1000 times the width of metal lines in said fine line interconnecting metallization structure.
 11. The method of claim 1 wherein each layer of said fine line interconnecting metallization structure is a single bulk layer of aluminum and wherein each layer of said post-passivation metallization system does not comprise aluminum, but comprises: an adhesion/barrier layer; a seed layer overlying said adhesion/barrier layer; and a bulk metal layer overlying said seed layer wherein a clear boundary exists between said seed layer and said bulk metal layer wherein there is different grain size and/or orientation on the two sides of said boundary.
 12. The method of claim 1 wherein each layer of said fine line interconnecting metallization structure comprises a layer of copper surrounded on a bottom and all sides with an adhesion/barrier layer wherein said adhesion/barrier layer is not undercut and wherein each layer of said post-passivation metallization system comprises: a post-passivation adhesion/barrier layer; a seed layer overlying said adhesion/barrier layer; and a bulk metal layer overlying said seed layer said post-passivation adhesion/barrier layer does not surround said bulk layer on its sides and wherein said post-passivation adhesion/barrier layer has an undercut under said seed layer.
 13. The method of claim 1 wherein said passivation layer is selected from the group comprising silicon nitride, silicon oxynitride, phosphosilicate glass (PSG), borosilicate glass (BSG), borophosphosilicate glass (BPSG), and combinations thereof.
 14. The method of claim 13 further comprising a layer of CVD silicon oxides under said passivation layer.
 15. The method of claim 13 wherein said passivation layer comprises at least a layer of silicon nitride with a thickness greater than 0.3 microns.
 16. The method of claim 13 wherein said passivation layer comprises a least a layer of silicon oxynitride with thickness greater than 0.3 microns.
 17. The method of claim 1 further comprising depositing a polymer insulating layer over said passivation layer, and forming second openings in said polymer, insulating layer to expose said contact pads, prior to forming said post-passivation metallization system.
 18. The method of claim 17 wherein said polymer is selected from the group comprising polyimide, BCB, parylene, epoxy-based materials, and elastomer.
 19. The method of claim 18 wherein said second openings in said polymer layer are lined up with said first openings in said passivation layer, and the size of said second openings is greater than that of said first openings.
 20. The method of claim 19 wherein said first openings in said passivation layer are formed to between about 0.1 and 50 um.
 21. The method of claim 4 wherein second and subsequent metal layers of said post-passivation metallization system are formed comprising the steps of: depositing a next polymer layer over said post-passivation metal lines; forming a via opening to said underlying post-passivation metal lines through said next polymer layer; sputtering a next adhesion/barrier layer in said via opening and over said next polymer layer; sputtering a next seed metal layer, over said next adhesion/barrier layer; depositing a layer of photoresist over said next seed metal layer; forming next openings in said photoresist over and extended from said via openings, said next openings defining metal lines for a next metal layer of said post-passivation metallization system; electroplating a metal layer in said via openings, forming metal lines in said next metal layer; removing said photoresist; and removing said next seed metal layer and said next adhesion/barrier layer in areas not covered by said next metal lines.
 22. The method of claim 21 further comprising planarizing said next polymer layer after said forming said via opening, and before said sputtering said next adhesion/barrier layer.
 23. The method of claim 22 wherein said planarizing is performed by chemical-mechanical polishing.
 24. The method of claim 21 further comprising planarizing said next polymer layer after said depositing said next layer of polymer, and before said forming said via opening.
 25. The method of claim 24 wherein said planarizing is performed by chemical-mechanical polishing.
 26. The method of claim 1 wherein silicon-based oxide layers are used as intermetal dielectric layers in said fine line metallization structure and are deposited by chemical vapor deposition, and wherein polymer layers are used as intermetal dielectric layers in said post-passivation metal structure and are deposited by spin coating, by screen printing, or by laminating a dry film of said polymer.
 27. The method of claim 26 wherein said polymer layers are thicker than said silicon-based oxide layers by a ratio of between about 2 and
 500. 28. The method of claim 26 wherein said silicon-based oxide layers comprise CVD silicon oxide, CVD TEOS, SOG, FSG, high density plasma CVD oxides, or a composite layer formed by a portion of these materials.
 29. The method of claim 26 wherein said polymer comprises polyimide, benzocyclobutene (BCB), parylene, an epoxy-based material, or an elastomer.
 30. The method of claim 1 wherein said fine line metallization structure is fabricated in a clean room environment of Class 10 or less and wherein said post-passivation metallization system is fabricated in a clean room environment of Class 100 or more.
 31. The method of claim 1 wherein said fine line metallization structure is fabricated using 5× steppers or scanners or better with a photoresist thickness of less than about 5 microns and wherein said post-passivation metallization system is fabricated using aligners or 1× steppers with a photoresist thickness of greater than about 5 microns.
 32. The method of claim 1 wherein said first RC product is smaller than said second RC product by at least 10 times.
 33. The method of claim 1 wherein said first RC product is smaller than said second RC product by at least 50 times.
 34. The method of claim 1 wherein said first RC product is smaller than said second RC product by at least 100 times.
 35. The method of claim 1 wherein said first RC product is smaller than said second RC product by at least 500 times.
 36. The method of claim 1 wherein said first RC product is smaller than said second RC product by at least 1,000 times.
 37. The method of claim 1 wherein said RC first product is smaller than said second RC product by at least 5,000 times.
 38. The method of claim 1 wherein said first RC product is smaller than said second RC product by at least 10,000 times.
 39. A method for forming a post-passivation metallization system for high performance integrated circuits, comprising: providing an integrated circuit comprising a plurality of devices formed in and on a semiconductor substrate, with an overlaying interconnecting fine line metallization structure connected to said devices and comprising a plurality of first metal lines in one or more layers, and having a passivation layer formed thereover, with first openings in said passivation layer to contact pads connected to said first metal lines; depositing a polymer layer over said passivation layer, and forming second openings in said polymer layer to expose said contact pads, wherein said second openings in said polymer layer are lined up with said first openings in said passivation layer, and the size of said second openings is greater than that of said first openings; and forming, in a selective deposition process, said post-passivation metallization system in said first openings and over said passivation layer, connected to said interconnecting fine line metallization structure, wherein said post-passivation metallization system comprises a plurality of top metal lines, in one or more layers, having a resistance times capacitance (first RC product) smaller than a second RC product of said first metal lines by at least 5 times.
 40. The method of claim 39 wherein said first openings in said passivation layer are formed to a size as small as 0.1 um.
 41. The method of claim 39 wherein said passivation layer comprises at least a nitride layer having a thickness of greater than about 0.3 microns.
 42. The method of claim 39 wherein said post-passivation metallization system connects portions of said interconnecting fine line metallization structure to other portions of said interconnecting fine line metallization structure.
 43. The method of claim 39 wherein said post-passivation metallization system connects portions of said interconnecting fine line metallization structure to external circuits by solder bumps, gold bumps, or wirebonds.
 44. The method of claim 39 wherein forming each layer of said post-passivation metallization system comprises the steps of: sputtering a thin metal layer; depositing a layer of photoresist over said thin metal layer; forming openings in said photoresist, said openings defining metal lines for said each metal layer of said post-passivation metallization system; electroplating a metal layer in said openings, forming metal lines in said each metal layer; removing said photoresist; and removing said thin metal layer in areas not covered by said metal lines.
 45. The method of claim 44 wherein said sputtering a thin metal layer comprises the steps of: sputtering an adhesion/barrier layer; and sputtering an electroplating seed layer over said adhesion/barrier layer.
 46. The method of claim 45 wherein said adhesion/barrier layer is selected from the group comprising titanium tungsten (TiW), chromium (Cr), titanium (Ti), tantalum nitride (TaN), and titanium nitride (TiN), and is deposited to a thickness of between about 0.01 and 3 microns.
 47. The method of claim 45 wherein said electroplating seed layer is selected from the group comprising copper (Cu), gold (Au), silver (Ag), palladium (Pd) and nickel (Ni) to a thickness of between about 0.05 and 3 microns.
 48. The method of claim 45 wherein said metal layer is selected from the group comprising copper (Cu), gold (Au), silver (Ag), palladium (Pd) and nickel (Ni) to a thickness of between about 2 and 100 microns.
 49. The method of claim 44 wherein said removing a thin metal layer comprises the steps of: removing said electroplating seed layer; and removing said adhesion/barrier layer.
 50. The method of claim 39 wherein said polymer is selected from the group comprising polyimide, BCB, parylene, epoxy-based material, and elastomer.
 51. The method of claim 39 wherein said RC first product is smaller than said second RC product by 5 to 10,000 times.
 52. A semiconductor device structure, comprising: semiconductor devices formed on a semiconductor substrate, with an overlaying interconnecting fine line metallization structure connected to said devices and comprising a plurality of first metal lines in one or more layers, and having a passivation layer formed thereover, with first openings in said passivation layer to contact pads connected to said first metal lines, wherein said first openings are as small as 0.1 um; and a post-passivation metallization system formed in said openings and over said passivation layer, connected to said interconnecting metallization structure, wherein said post-passivation metallization system comprises a plurality of top metal lines, in one or more layers, having a resistance times capacitance (first RC product) smaller than a second RC product of said first metal lines by at least 5 times.
 53. The structure of claim 52 wherein each layer of said post-passivation metallization system comprises: a thin adhesion/barrier layer, in said first openings and over said passivation layer; a thin seed layer, formed over said thin adhesion/barrier layer; and a thick metal layer formed over said seed layer.
 54. The structure of claim 53, further comprising a cap layer formed over said thick metal layer.
 55. The structure of claim 54, wherein said cap layer comprises nickel (Ni).
 56. The structure of claim 53 wherein said thin adhesion/barrier layer is selected from the group comprising titanium tungsten (TiW), chromium (Cr), titanium (Ti), tantalum nitride (TaN), and titanium nitride (TiN), and has a thickness of between about 0.01 and 3 microns.
 57. The structure of claim 53 wherein said thin seed layer is selected from the group comprising copper (Cu), gold (Au), silver (Ag), palladium (Pd), and nickel (Ni) and has a thickness of between about 0.05 and 3 microns.
 58. The structure of claim 53 wherein said thick metal layer is selected from the group comprising copper (Cu), gold (Au), silver (Ag), palladium (Pd), and nickel (Ni) and has a thickness of between about 2 and 100 microns.
 59. The structure of claim 52 wherein said each of said top metal lines has a width of greater than or equal to 2 microns.
 60. The structure of claim 52 wherein said each of said top metal lines has a line spacing of greater than or equal to 2 microns.
 61. The structure of claim 52 wherein said passivation layer comprises material selected from the group comprising silicon nitride, silicon oxynitride, phosphosilicate glass (PSG), borosilicate glass (BSG), borophosphosilicate glass (BPSG), and combinations thereof.
 62. The structure of claim 61 further comprising a layer of CVD silicon oxides under said passivation layer.
 63. The structure of claim 52 wherein said passivation layer comprises at least a layer of silicon nitride with a thickness greater than 0.3 microns.
 64. The structure of claim 52 wherein said passivation layer comprises a least a layer of silicon oxynitride with thickness greater than 0.3 microns.
 65. The structure of claim 52 further comprising a polymer insulating layer formed over said passivation layer, wherein second openings in said polymer insulating layer are formed over said first openings.
 66. The structure of claim 65 wherein said second openings in said polymer insulating layer are larger than said first openings.
 67. The structure of claim 65 wherein said polymer insulating layer has a thickness of between about 2 and 100 microns.
 68. The structure of claim 65 wherein said second openings in said polymer insulating layer are greater than or equal to 2 microns.
 69. The structure of claim 65 wherein said polymer insulating layer is formed of a material selected from the group comprising polyimide, BCB, parylene, epoxy-based materials, and elastomer.
 70. The structure of claim 52 further comprising intermetal polymer layers, formed between said top metal lines, to a thickness of between about 2 and 100 microns.
 71. The structure of claim 70 wherein said intermetal polymer layer further comprises openings with a size greater than or equal to 2 microns.
 72. The structure of claim 70 wherein intermetal dielectric layers formed in said fine line metallization structure comprise silicon-based oxide and wherein said intermetal polymer layers are thicker than said silicon-based oxide layers by a ratio of between about 2 and
 500. 73. The structure of claim 70 wherein said intermetal polymer layers are formed of a material selected from the group comprising polyimide, BCB, parylene, epoxy-based materials, and elastomer.
 74. The structure of claim 72 wherein said silicon-based oxide layers comprise CVD silicon oxide, CVD TEOS, SOG, FSG, high density plasma CVD oxides, or a composite layer formed by a portion of these materials.
 75. The structure of claim 53 wherein each layer of said fine line interconnecting metallization structure is a single bulk layer of aluminum and wherein each layer of said post-passivation metallization system comprises said adhesion/barrier layer, said thin seed layer; and said thick metal layer wherein said thin seed layer and said thick metal layer are formed from a same metal and wherein a clear boundary exists between said thin seed layer and said thick metal layer wherein there is different grain size and/or orientation on the two sides of said boundary.
 76. The structure of claim 75 wherein said adhesion/barrier layer in said post-passivation metallization system has an undercut under said seed layer, wherein said undercut is about 0.03 microns to 2 microns per side.
 77. The structure of claim 53 wherein each layer of said fine line interconnecting metallization structure comprises a layer of copper surrounded on a bottom and all sides with an adhesion/barrier layer wherein said adhesion/barrier layer is not undercut and wherein each layer of said post-passivation metallization system comprises said post-passivation adhesion/barrier layer, said a seed layer; and said electroplated metal layer wherein said post-passivation adhesion/barrier layer does not surround said electroplated layer on its sides and wherein said post-passivation adhesion/barrier layer has an undercut under said seed layer.
 78. The structure of claim 77 wherein said undercut is about 0.03 microns to 2 microns per side.
 79. The structure of claim 52 wherein said RC first product is smaller than said second RC product by 5 to 10,000 times.
 80. The structure of claim 52 wherein lower contact points are formed in a top layer of said fine line interconnecting metallization structure and exposed through said first openings in said passivation layer; wherein solder bumps, gold bumps, or wirebonds are formed on said lower contact points.
 81. The structure of claim 52 wherein upper contact points are formed in a top layer of said post-passivation metallization system; and wherein solder bumps, gold bumps, or wirebonds are formed on said upper contact points.
 82. The structure of claim 52 wherein said post-passivation metallization system is configured to provide fan-out capabilities comprising: a plurality of contact points on a top surface of said post-passivation metallization system wherein each of said plurality of contact points is connected to a said contact pad through said post-passivation metallization structure wherein a separation between said contact points is larger than a separation between said contact pads.
 83. The structure of claim 82 wherein solder bumps, gold bumps, or wirebonds are formed on said contact points.
 84. The structure of claim 52 wherein said post-passivation metallization system is configured to provide relocation capabilities comprising: a plurality of contact points on a top surface of said post-passivation metallization system wherein each of said plurality of contact points is connected to a said contact pad through said post-passivation metallization structure wherein said contact points are in a different sequence from a sequence of said contact pads.
 85. The structure of claim 84 wherein solder bumps, gold bumps, or wirebonds are formed on said contact points.
 86. The structure of claim 52 wherein said post-passivation metallization system is configured to provide reduction capabilities comprising: a plurality of contact points on a top surface of said post-passivation metallization system wherein each of said plurality of contact points is connected to at least one said contact pad through said post-passivation metallization structure wherein said contact points are fewer in number than said contact pads.
 87. The structure of claim 86 wherein solder bumps, gold bumps, or wirebonds are formed on said contact points.
 88. The structure of claim 52 wherein said post-passivation metallization system is configured to provide additional capabilities comprising: a plurality of contact points on a top surface of said post-passivation metallization system wherein each of said contact pads of said fine line metallization structure is connected to at least one of said plurality of contact points through said post-passivation metallization structure wherein said contact points are more in number than said contact pads.
 89. The structure of claim 88 wherein solder bumps, gold bumps, or wirebonds are formed on said contact points.
 90. A semiconductor device structure, comprising: semiconductor devices formed on a semiconductor substrate, with an overlaying interconnecting fine line metallization structure connected to said devices and comprising a plurality of first metal lines in one or more layers, and having a passivation layer formed thereover, with first openings in said passivation layer to contact pads connected to said first metal lines, wherein said first openings are as small as 0.1 um; and a post-passivation metallization system formed in said openings and over said passivation layer, connected to said interconnecting metallization structure, wherein said post-passivation metallization system comprises a plurality of top metal lines, in one or more layers, connecting portions of said interconnecting fine line metallization structure to other portions of said interconnecting fine line metallization structure wherein each of said top metal lines has a thickness of between about 2 and 100 μm.
 91. The structure of claim 90 wherein said post-passivation metallization system comprises power buses, power planes, ground buses, and/or ground planes.
 92. The structure of claim 90 wherein each layer of said post-passivation metallization system comprises: a thin adhesion/barrier layer; a thin seed layer, formed over said thin adhesion/barrier layer; and a thick metal layer formed over said seed layer.
 93. The structure of claim 92 further comprising a cap layer formed over said thick metal layer.
 94. The structure of claim 93 wherein said cap layer comprises nickel (Ni).
 95. The structure of claim 92 wherein said thin adhesion/barrier layer is selected from the group comprising titanium tungsten (TiW), chromium (Cr), titanium (Ti), tantalum nitride (TaN), and titanium nitride (TiN), and has a thickness of between about 0.01 and 3 microns.
 96. The structure of claim 92 wherein said thin seed layer is selected from the group comprising copper (Cu), gold (Au), silver (Ag), palladium (Pd), and nickel (Ni) and has a thickness of between about 0.05 and 3 microns.
 97. The structure of claim 92 wherein said thick metal layer is selected from the group comprising copper (Cu), gold (Au), silver (Ag), palladium (Pd), and nickel (Ni).
 98. The structure of claim 90 wherein said each of said top metal lines has a width of greater than or equal to 2 microns.
 99. The structure of claim 90 wherein said each of said top metal lines has a line spacing of greater than or equal to 2 microns.
 100. The structure of claim 90 wherein said passivation layer comprises material selected from the group comprising silicon nitride, silicon oxynitride, phosphosilicate glass (PSG), borosilicate glass (BSG), borophosphosilicate glass (BPSG), and combinations thereof.
 101. The structure of claim 100 further comprising a layer of CVD silicon oxides under said passivation layer.
 102. The structure of claim 90 wherein said passivation layer comprises at least a layer of silicon nitride with a thickness greater than 0.3 microns.
 103. The method of claim 90 wherein said passivation layer comprises a least a layer of silicon oxynitride with thickness greater than 0.3 microns.
 104. The structure of claim 90 further comprising a polymer insulating layer formed over said passivation layer, wherein second openings in said polymer insulating layer are formed over said first openings.
 105. The structure of claim 104 wherein said polymer insulating layer has a thickness of between about 2 and 100 microns.
 106. The structure of claim 104 wherein said second openings in said polymer insulating layer are larger than said first openings.
 107. The structure of claim 104 wherein said second openings in said polymer insulating layer are greater than or equal to 2 microns.
 108. The structure of claim 104 wherein said polymer insulating layer is formed of a material selected from the group comprising polyimide, BCB, parylene, epoxy-based materials, and elastomer.
 109. The structure of claim 90 further comprising intermetal polymer layers, formed between said top metal lines, to a thickness of between about 2 and 100 microns.
 110. The structure of claim 109 wherein said intermetal polymer layer further comprises openings with size greater than or equal to 2 microns.
 111. The structure of claim 110 wherein intermetal dielectric layers formed in said fine line metallization structure comprise silicon-based oxide and wherein said intermetal polymer layers are thicker than said silicon-based oxide layers by a ratio of between about 2 and
 500. 112. The structure of claim 110 wherein said intermetal polymer layers are formed of a material selected from the group comprising polyimide, BCB, parylene, epoxy-based materials, and elastomer.
 113. The structure of claim 111 wherein said silicon-based oxide layers comprise CVD silicon oxide, CVD TEOS, SOG, FSG, high density plasma CVD oxides, or a composite layer formed by a portion of these materials.
 114. The structure of claim 90 wherein each layer of said fine line interconnecting metallization structure is a single bulk layer of aluminum and wherein each layer of said post-passivation metallization system comprises said adhesion/barrier layer, said seed layer; and said an electroplated metal layer wherein said seed layer and said electroplated layer are formed from a same metal and wherein a clear boundary exists between said seed layer and said electroplated metal layer wherein there is different grain size and/or orientation on the two sides of said boundary.
 115. The structure of claim 114 wherein said adhesion/barrier layer in said post-passivation metallization system has an undercut under said seed layer, wherein said undercut is about 0.03 microns to 2 microns per side.
 116. The structure of claim 90 wherein each layer of said fine line interconnecting metallization structure comprises a layer of copper surrounded on a bottom and all sides with an adhesion/barrier layer wherein said adhesion/barrier layer is not undercut and wherein each layer of said post-passivation metallization system comprises said post-passivation adhesion/barrier layer, said a seed layer; and said electroplated metal layer wherein said post-passivation adhesion/barrier layer does not surround said electroplated layer on its sides and wherein said post-passivation adhesion/barrier layer has an undercut under said seed layer.
 117. The structure of claim 116 wherein said undercut is about 0.03 microns to 2 microns per side.
 118. The structure of claim 90 wherein a resistance times capacitance of said post-passivation metallization system is smaller than a resistance times capacitance of said fine line metallization structure by 5 to 10,000 times.
 119. The structure of claim 90 wherein lower contact points are formed in a top layer of said fine line interconnecting metallization structure and exposed through said first openings in said passivation layer wherein solder bumps, gold bumps, or wirebonds are formed on said lower contact points.
 120. The structure of claim 90 wherein upper contact points are formed in a top layer of said post-passivation metallization system and wherein solder bumps, gold bumps, or wirebonds are formed on said upper contact points. 